lmkd/tests: Consume memory more aggressively to avoid test timeout am: 2bf5487381 am: 99cb321008 am: c701f32c23 am: 81b6597577
Original change: https://android-review.googlesource.com/c/platform/system/memory/lmkd/+/1972099 Change-Id: I7f4504ff20c0029d8c208739187c363f55b3f321
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@ -47,8 +47,8 @@ using namespace android::base;
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// Test constant parameters
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// Test constant parameters
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#define OOM_ADJ_MAX 1000
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#define OOM_ADJ_MAX 1000
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#define ALLOC_STEP (ONE_MB)
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#define ALLOC_STEP (5 * ONE_MB)
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#define ALLOC_DELAY 1000
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#define ALLOC_DELAY 200
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// used to create ptr aliasing and prevent compiler optimizing the access
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// used to create ptr aliasing and prevent compiler optimizing the access
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static volatile void* gptr;
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static volatile void* gptr;
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